Test / Reliability

Bartest X5 LIV spectral testing of edge-emitters (4secs/chip for LIV + 2xOSA)
Sub-mount Test Various auto test stations up to 85°C for a range of sub-mounts with detailed spectral analysis capability.
Farfield Auto wafer-scale testing of IV - Up to 4"
SOA Test Sophisticated characterisation of SOA-style devices
Wafer Probe Auto wafer-scale testing of IV - Up to 4"
Burnin Various ovens up to 150C. Unmonitored ACC drive control - Used for longterm reliability/ageing studies.
High Speed Testing 10G-40G test capability available through collaboration with G.U. eg S21, RIN.

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